Abstract: Accurate and efficient modeling of lateral double-diffused MOS (LDMOS) devices is critical for process optimization and reliability analysis, especially under limited simulation budgets.

Introduction Armed conflict severely impacts health, with indirect deaths often exceeding direct casualties two to four times ...

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Abstract: Shoot-through is an inherent topology defect of bridge-type inverters. Especially for multilevel inverters, the addition and compensation of dead-time have higher requirements for control ...

Cui, J.X., Liu, K.H. and Liang, X.J. (2026) A Brief Discussion on the Theory and Application of Artificial Intelligence in ...