Abstract: Map-aided localization using 3D lidar scan points is an essential and fundamental technology in the field of Intelligent Vehicles (IVs) research, which can estimate the position and ...
Indonesian rescuers recovered 10 bodies that were swept away in flash floods or buried under tons of mud and rocks that hit ...
Abstract: Wafer map defect classification is a crucial task in semiconductor manufacturing, as early detection of defects improves yield and minimizes production waste. This study proposes an enhanced ...
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