Abstract: Localized hotspots across high-power-density monolithic systems-on-chip (SoCs) and heterogenous 3D SoCs with integrated voltage regulators (IVR) pose major bottlenecks to performance and ...
Abstract: Very low frequency (VLF) withstand and other diagnostic tests and measurements that are performed using VLF energization in the field on shielded power cable systems are described in this ...
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