Your USB-C cables aren’t broken. This $14 tester shows what’s really going on

I have a drawer full of USB cables and every time I want to connect a device, I have to try them out. USB-C was supposed to ...
IEEE

Enabling Efficient Pure-NMOS Circuits Through Adiabatic Complementary Pass-Transistor Logic

Abstract: For many emerging computing technologies, such as wearable and flexible IoT devices, power and energy consumption may be of far greater importance than performance and operating frequency.
The Navhind Times

Behind every circuit

Shreya M. Naik In today’s fast-growing world of technology, electronic devices play a vital role in every field, from communication and healthcare to manufacturing and entertainment. Behind the smooth ...

ASML's most advanced EUV machine is now central to Intel's comeback strategy

Intel recently confirmed the latest results in its partnership with ASML. The US chipmaker worked with engineers from the European corporation to install, test, and validate ...
IEEE

Worst Case Heavy Ion Testing Conditions for Normally Off GaN-Based High Electron Mobility Transistor

Abstract: Single Event Effect of GaN HEMT devices is usually done using the same testing conditions as the one developed and validated a long time ago for MOSFETs components. This paper presents two ...