Abstract: Transistor scaling and 3D integration have led to high power densities and operating temperatures, which degrade circuit reliability and performance. Layout complexities and nanoscale ...
Abstract: Severe heat generation in power electronic devices is often the biggest culprit in harming their reliability. Our work analyses the heat loss composition and numerically calculates each ...
In this open-access publication we introduced and validated the thermal model for a Czochralski crystal growth process: A. Enders-Seidlitz, J. Pal, and K. Dadzis, Development and validation of a ...
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