Abstract: In embedded systems, efficient deep learning solutions are crucial to balance accuracy and resource constraints. Early Exit Neural Networks offer a promising solution, but their manual ...
Abstract: A new edge detection method is proposed for the inspection of navel orange surface defects, enabling precise defect localization, classification type, and size estimation. This study ...
In line with the shift to more sophisticated devices seen in recent years, demands have emerged for even greater miniaturization in cutting-edge semiconductors, leading to advances in Extreme ...
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