Abstract: In this work, a semi-analytical compact model of random process fluctuations in nanosheet (NS) gate-all-around (GAA) complementary FET (CFET) is proposed, including work-function variation ...
Abstract: Due to abrupt changes in the intrinsic degradation mechanism or shock from external environmental pressure, degradations of some equipment are characterized by multi-phase and jumps.
From a standardized perspective, the business process model and notation (BPMN), a widely spread general-purpose process formalism, has been used for conceptual modeling in clinical domains, mainly ...
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