Abstract: Long-range Wide Area Networks (LoRaWAN) have recently gained popularity by offering wide-area coverage to low-power Internet of Things (IoT) monitoring devices in remote areas. LoRAWAN suits ...
Analysis of Single-Event Leakage Current Degradation Induced by Heavy-Ion Irradiation in SiC MOSFETs
Abstract: The application of silicon carbide MOSFETs (SiC MOSFETs) in space is severely restricted by single-event burnout (SEB) and single-event leakage current (SELC) induced by heavy ions, yet the ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results