Analysis of Single-Event Leakage Current Degradation Induced by Heavy-Ion Irradiation in SiC MOSFETs
Abstract: The application of silicon carbide MOSFETs (SiC MOSFETs) in space is severely restricted by single-event burnout (SEB) and single-event leakage current (SELC) induced by heavy ions, yet the ...
West Bengal's Booth Level Officers protested at the Chief Electoral Officer's office, demanding compensation after a colleague suffered a brain stroke due to work stress. They argue that BLOs, crucial ...
Abstract: Parameter mismatches can significantly degrade the control performance of model predictive current control (MPCC). To improve the parameter robustness of MPCC for permanent magnet ...
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