Abstract: Wafer maps of large-scale integration chips are matrices showing the defective chip position on a wafer. Determining defect patterns on wafer maps is crucial because these patterns indicate ...
By applying machine learning techniques, engineers at MIT have created a new method for 3D printing metal alloys that produce ...
Abstract: In the classical tracking-by-detection (TBD) paradigm, detection and tracking are separately and sequentially conducted, and data association must be properly performed to achieve ...
/ - base engine class, config, include base/ - shader and program compilators, texture class buffer/ - buffers e.g framebuffers camera/ - classes of cameras renderable/ - everything what you can ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results
Feedback