Abstract: In this work, a semi-analytical compact model of random process fluctuations in nanosheet (NS) gate-all-around (GAA) complementary FET (CFET) is proposed, including work-function variation ...
Image2Net: Datasets, Benchmark and Hybrid Framework to Convert Analog Circuit Diagrams into Netlists
Abstract: Large Language Model (LLM) exhibits great potential in designing of analog integrated circuits (IC) because of its excellence in abstraction and generalization for knowledge. However, ...
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