Abstract: Aging effect is one of the critical factors causing circuit reliability degradation due to negative bias temperature instability (NBTI) with continuous and intense logic operation. While ...

Learn a step-by-step system to solve almost any circuit question, from basic resistor networks to multi-loop and node-voltage ...

Abstract: The emerging computation-in-memory (CIM) architecture effectively overcomes the limitations, such as memory wall and rise in the standby power dissipation associated with the conventional ...