As technology nodes shrink to 90 nanometers and below, chips become much more difficult to manufacture. In-die process variations increase substantially at 90 nm — even more at 65 nm. If these effects ...

Six Sigma provides a framework for measuring process performance and making improvements to better meet customer needs. Although full-scale Six Sigma implementations are usually limited to large ...

The rising complexities of semiconductor processes and design are driving an increasing use of on-chip monitors to support data analytics from an IC’s birth through its end of life — no matter how ...

Measurement system analysis (MSA) is an essential discipline that underpins the accuracy and reliability of data in quality control and manufacturing processes. By quantifying measurement variability, ...

Solid, gage-proven metrology is a critical tool for process control across all industrial settings. A good measurement system allows manufacturers to keep parts within tight specification limits.