Performs electron microscopy. It can also be used to do electron beam lithography. Open on a case-by-case basis to academic and national lab users ...
AFM images are generated by the mechanical motion of a fine tip in close proximity to a sample surface. Charge density, physical topography, magnetic field and other surface properties interact with ...
A focused ion beam scanning electron microscope (FIB-SEM) featuring a compact Time-of-Flight Secondary Ion Mass Spectrometer (ToF-SIMS) and a traditional microanalytical method of Energy Dispersive ...
In this interview, industry expert Chris Schwalb provides an overview of the FusionScope®. He explains how this new instrument is transforming correlative microscopy with its innovative AFM-SEM ...
The high spatial resolutions of scanning electron microscopy (SEM) have proved invaluable in nanomaterial development, with the ability to resolve even single atoms on a surface. 1 The spatial ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results
Feedback