The family of electron microscopy techniques have become staple methods for imaging nanoscale objects, including nanoparticles, viruses and proteins. The appeal of electron microscopy as a ...
The Helmholtz Center for Materials and Energy in Berlin, Germany (HZB, originally known as Hahn-Meitner Institute, HMI) has developed a novel technique for the cross-sectional sample preparation for ...
Atomic force microscopy (AFM) is a very popular analysis tool for 3D surface topology visualization and other measurements on a wide range of materials at nanoscales ...
This article examines the use of femtosecond (fs) laser ablation for site-specific TEM sample preparation in a FIB-SEM. Various workflows are shown facilitating TEM lamella preparation of regions of ...
Sample preparation will vary depending on the sample, imaging mode, and size of desired images. You will likely need to do a literature search to find the preparation best for your sample. Smaller ...
(Nanowerk News) National University of Singapore (NUS) physicists have developed a computational imaging technique to extract three-dimensional (3D) information from a single two-dimensional (2D) ...
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