EDN

Rack instrument unites JTAG, functional test

The DataBlaster JT 37×7 rack-mounted instrument (RMI) lets users combine boundary-scan test with functional validation. The RMI supports all boundary-scan test applications, including IEEE 1149.6 ...
Electronic Design

Common Core ATE for Functional Testing

The approach to high-end aerospace/defense test system development is shifting from application-specific systems to common core automated systems to reduce overall cost and increase flexibility.
Semiconductor Engineering

Device Validation: The Ultimate Test Frontier

This article is a condensed version of an article that appeared in the November/December 2022 issue of Chip Scale Review. Adapted with permission. Read the original ...
EDN

Combining functional and in-circuit test

CheckSum’s Analyst ems+ft system combines in-circuit test (ICT) and functional test to target OEMs and contract manufacturers building power supplies, automotive electronics, medical electronics, ...
Electronic Design

Bus Emulation Techniques Enhance Functional Testing

Test engineers often are challenged with the task of simulating the environment in which the unit under test (UUT) will operate. To implement such a test, engineers use hot mock-up, embedded software, ...